XF, Passive, 30 MHz up to 6 GHz The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.
XF1 set, Near-Field Probes 30 MHz up to 6 GHz The XF1 set consists of four magnetic field probes and one E-field probe for measuring E-fields and magnetic fields from 30 MHz to 6 GHz on electronic assemblies during the development stage. Due to their integrated impedance matching, the probes are less sensitive in the lower frequency range than …
XF-R 400-1, H-Field Probe 30 MHz up to 6 GHz Due to its large diameter (25 mm) and its high resolution, the XF-R 400-1 H-field probe is suitable for measurements at distances up to 10 cm around assemblies and devices.
XF-R 100-1, H-Field Probe 30 MHz up to 6 GHz The XF-R 100-1 H-field probe is suitable for measurements around assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can identify larger components as potential sources of interference. The magnetic field probe has a very high bandwidth and linearity.
XF-R 3-1, H-Field Probe 30 MHz up to 6 GHz The XF-R 3-1 near-field probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
XF-B 3-1, H-Field Probe 30 MHz up to 6 GHz The measurement coil of the XF-B 3-1 H-field probe is set at a 90° angle to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boards, which are ty…
XF-U 2.5-1, H-Field Probe 30 MHz up to 6 GHz The XF-U 2.5-2 near-field probe is designed for the selective measurements of RF currents in conducting paths, component connectors, SMD components, and IC pins. The probe head has a magnetically active gap with an approx. width of 0.5 mm. To use, the head should be positioned directly onto the meas…
XF-E 04s, E-Field Probe 30 MHz up to 6 GHz The electrode on the probe head of the XF-E 04s near-field probe detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly.
XF-E 09s, E-Field Probe 30 MHz up to 6 GHz The electrode on the probe head of the XF-E 09s near-field probe detects electrical fields which, for example are decoupled above the IC's surface. The probe's resolution allows for measurements at a distance of 0.5 mm upto 10 mm above an assembly.
XF-E 10, E-Field Probe 30 MHz up to 6 GHz The electrode in the probe head of the XF-E 10 has a width of approx. 0.2 mm. With the probe even smallest E-field sources can be located, e.g. conducting paths with a width of 0.1 mm or single pins on multi pinned ICs. To measure, the E-field probe is positioned onto the object.