LF1 set Near-Field Probes 100 kHz up to 50 MHz The LF1 near-field probe set consists of four shielded near-field probes for measuring emissions of longwave, medium wave, and shortwave frequencies on electronic devices during the development process. The probe heads of the LF1 set are designed for the incremental detection of electromagnetic int…
LF-R 400, H-Field Probe 100 kHz up to 50 MHz The LF-R 400 H-field probe has a large diameter (25 mm), which makes it highly sensitive and suitable for measurements within ranges up to 10 cm around assemblies and devices.
LF-R 50, H-Field Probe 100 kHz up to 50 MHz The H-field probe LF-R 50 is designed to measure assemblies, devices, or cables at a distance up to 3 cm. This allows larger components to be detected as possible sources of interference.
LF-R 3, H-Field Probe 100 kHz up to 50 MHz The LF-R 3 near-field probe detects high resolution RF magnetic fields directly on assemblies, for example, in the area around IC pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
LF-B 3, H-Field Probe 100 kHz up to 50 MHz The measuring coil of the H-field probe LF-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured. This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. be…
LF-U 5, H-Field Probe 100 kHz up to 50 MHz The H-field probe LF-U 5 is specially designed for detecting magnetic fields at wide conducting paths, cables, connectors, electronic components, cables and their connectors. The probe functions like a coupling clamp.
LF-U 2.5, H-Field Probe 100 kHz up to 50 MHz The H-field probe LF-U 2.5 is a near-field probe. It is designed for the selective detection of RF current in conducting paths, SMD components and IC pins. The head of the probe has a magnetically active gap with a width of approx. 0.5 mm.
LF-K 7, H-Field Probe 100 kHz up to 50 MHz The LF-K 7 near-field probe has two coils, which detect semi-circular magnetic field lines. Such magnetic field lines occur at lines, rod-like constructional components, cable connectors, and along edges of flat constuctional components. The probe functions like a coupling clamp.